Book chapter
Models for Delay Faults
Models in Hardware Testing, pp.71-103
Frontiers in Electronic Testing, Springer Netherlands
10/27/2009
DOI: 10.1007/978-90-481-3282-9_3
Abstract
In this chapter fault models used to model the effects of defects causing excessive circuit delays are discussed. Methods to generate tests to detect modeled faults and design for test methods to improve fault coverage are reviewed. Current work in detecting what are called small delay defects is discussed.
Details
- Title: Subtitle
- Models for Delay Faults
- Creators
- Sudhakar M Reddy - University of Iowa
- Resource Type
- Book chapter
- Publication Details
- Models in Hardware Testing, pp.71-103
- Publisher
- Springer Netherlands; Dordrecht
- Series
- Frontiers in Electronic Testing
- DOI
- 10.1007/978-90-481-3282-9_3
- ISSN
- 0929-1296
- Language
- English
- Date published
- 10/27/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197905902771
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