Device characterization is an extremely important aspect of any laboratory at any scale. As electronic devices are fabricated, whether it be using new materials, designs, or processes, accurate characterization of these devices is essential. In the interest of consistency, automation of the characterization process is essential. These devices are essential in areas of nanoelectronics, spintronics and energy harvesting technologies. In this context, the interfacings of laboratory characterization instruments with computers can be a difficult and resource intensive task. In this project, we present a package of automated software solutions to this problem for select laboratory instruments.
Conference poster
Matlab-based Nanoscale Device Characterization
SURF 2011 (Spring Undergraduate Research Festival) (Iowa City, Iowa)
03/26/2011
Abstract
Details
- Title: Subtitle
- Matlab-based Nanoscale Device Characterization
- Creators
- Paul R Haugen
- Contributors
- Hassan Raza (Mentor) - College of Engineering
- Resource Type
- Conference poster
- Conference
- SURF 2011 (Spring Undergraduate Research Festival) (Iowa City, Iowa)
- Copyright
- Copyright © 2011 Paul Haugen
- Grant note
- ICRU Research Fellow Award
- Comment
Major: Computer Engineering. Minor: Mathematics.
Also presented at RIC 2011 (Research in the Capitol)- Language
- English
- Date presented
- 03/26/2011
- Academic Unit
- Iowa Center for Research by Undergraduates
- Record Identifier
- 9984111973302771
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