3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set

Conference proceeding

I Pomeranz and S.M Reddy

The Fifth International Conference on VLSI Design, pp.148-153

1992

DOI: 10.1109/ICVD.1992.658037

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Automatic test pattern generation

Benchmark testing

Circuit faults

Circuit testing

Cities and towns

Electrical fault detection

Fault detection

Hardware

Legged locomotion

Test pattern generators

Title: Subtitle: 3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set
Creators: I Pomeranz - University of Iowa
S.M Reddy
Resource Type: Conference proceeding
Publication Details: The Fifth International Conference on VLSI Design, pp.148-153
Publisher: IEEE
DOI: 10.1109/ICVD.1992.658037
ISSN: 1063-9667
eISSN: 2380-6923
Language: English
Date published: 1992
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197341902771

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