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A Tale of Two Injectors: End-to-End Comparison of IR-Level and Assembly-Level Fault Injection
Conference proceeding

A Tale of Two Injectors: End-to-End Comparison of IR-Level and Assembly-Level Fault Injection

Lucas Palazzi, Guanpeng Li, Bo Fang and Karthik Pattabiraman
2019 IEEE 30th International Symposium on Software Reliability Engineering (ISSRE), Vol.2019-, pp.151-162
10/2019
DOI: 10.1109/ISSRE.2019.00024

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Abstract

comparison fault injection LLVM PIN resilience

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