A method of static test compaction based on don't care identification

Kohei Miyase; Seiji Kajihara; Sudhakar M Reddy

doi:10.1109/DELTA.2002.994657

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Conference proceeding

A method of static test compaction based on don't care identification

Kohei Miyase, Seiji Kajihara and Sudhakar M Reddy

Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, pp.392-395

2002

DOI: 10.1109/DELTA.2002.994657

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Abstract

In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, and next reassigns appropriate values to the don't cares to achieve test compaction. The procedure can be applied repeatedly, until further compaction cannot be derived. Experimental results show effectiveness of the proposed procedure for the ISCAS benchmark circuits.

Microelectronics

Circuit faults

Circuit testing

Combinational circuits

Compaction

Electrical fault detection

Electronic equipment testing

Fault detection

Logic testing

System testing

Details

Title: Subtitle: A method of static test compaction based on don't care identification
Creators: Kohei Miyase - Kyushu Institute of Technology
Seiji Kajihara
Sudhakar M Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, pp.392-395
DOI: 10.1109/DELTA.2002.994657
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197540802771

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