Conference proceeding
A new test generation method for sequential circuits
Computer-Aided Design: International Conference on (ICCAD '91), pp.446-449
01/01/1992
DOI: 10.1109/ICCAD.1991.185300
Abstract
A novel test generation method for synchronous sequential circuits is proposed. Among the new ideas employed are: 1) efficiently maintaining path information using an extended value system in forward time processing, and 2) efficiently enumerating cubes for state justification in backward time processing. Experimental results show that the proposed method is effective in generating high coverage tests for sequential circuits.
Details
- Title: Subtitle
- A new test generation method for sequential circuits
- Creators
- Dong Ho LeeSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Computer-Aided Design: International Conference on (ICCAD '91), pp.446-449
- DOI
- 10.1109/ICCAD.1991.185300
- Language
- English
- Date published
- 01/01/1992
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197915502771
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