A novel method of improving transition delay fault coverage using multiple scan enable signals

N Devtaprasanna; A Gunda; P Krishnamurthy; S.M Reddy; I Pomeranz

doi:10.1109/ICCD.2005.13

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Conference proceeding

A novel method of improving transition delay fault coverage using multiple scan enable signals

N Devtaprasanna, A Gunda, P Krishnamurthy, S.M Reddy and I Pomeranz

2005 International Conference on Computer Design, Vol.2005, pp.471-474

2005

DOI: 10.1109/ICCD.2005.13

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Abstract

We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles.

Circuit faults

Circuit testing

Delay

Design methodology

Electrical fault detection

Fault detection

Flip-flops

Integrated circuit testing

Signal design

Switches

Details

Title: Subtitle: A novel method of improving transition delay fault coverage using multiple scan enable signals
Creators: N Devtaprasanna - University of Iowa
A Gunda - LSI Corporation
P Krishnamurthy - LSI Corporation
S.M Reddy - University of Iowa
I Pomeranz - Purdue University West Lafayette
Resource Type: Conference proceeding
Publication Details: 2005 International Conference on Computer Design, Vol.2005, pp.471-474
DOI: 10.1109/ICCD.2005.13
ISSN: 1063-6404
eISSN: 2576-6996
Publisher: IEEE
Language: English
Date published: 2005
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197212202771

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