A postprocessing procedure of test enrichment for path delay faults

Conference proceeding

Irith Pomeranz and Sudhakar M Reddy

13th Asian Test Symposium, pp.448-453

Asian test symposium, 13th (Kenting, Taiwan, 11/15/2004–11/17/2004)

2004

DOI: 10.1109/ATS.2004.14

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Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: A postprocessing procedure of test enrichment for path delay faults
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 13th Asian Test Symposium, pp.448-453
Conference: Asian test symposium, 13th (Kenting, Taiwan, 11/15/2004–11/17/2004)
DOI: 10.1109/ATS.2004.14
ISSN: 1081-7735
eISSN: 2377-5386
Publisher: IEEE Computer Society
Language: English
Date published: 2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197265002771

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