Conference proceeding
A postprocessing procedure to reduce the number of different test lengths in a test set for scan circuits
Proceedings 10th Asian Test Symposium, pp.131-136
2001
DOI: 10.1109/ATS.2001.990271
Abstract
A test for a scan design typically starts with a scan-in operation followed by one or more primary input vectors, and ends with a scan-out operation. The length of a test is defined to be the number of primary input vectors included in it. We describe a procedure for reducing the number of different test lengths in a test set TS for a scan circuit. Reducing the number of different lengths reduces the complexity of applying TS to the circuit. The procedure we describe is a postprocessing procedure applied after test generation, and it does not require any modifications to the test generation procedure. A test length L/sub i/ is eliminated from TS by replacing all the tests of length L/sub i/ by tests of length L/sub j/ that exists in TS. In the first phase of the procedure, L/sub j/ < L/sub i/. In the second phase, L/sub j/ > L/sub i/. We present experimental results to demonstrate that significant reductions in the number of test lengths are possible.
Details
- Title: Subtitle
- A postprocessing procedure to reduce the number of different test lengths in a test set for scan circuits
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings 10th Asian Test Symposium, pp.131-136
- DOI
- 10.1109/ATS.2001.990271
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Publisher
- IEEE
- Language
- English
- Date published
- 2001
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197198302771
Metrics
20 Record Views