Conference proceeding
A scalable method for the generation of small test sets
Proceedings of the Conference on design, automation and test in europe, pp.1136-1141
DATE '09
04/20/2009
DOI: 10.1109/DATE.2009.5090834
Abstract
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compatible faults based on necessary assignments. It guides the justification and propagation decisions to create patterns that will accommodate most targeted faults. The technique presented achieves close to minimal test pattern sets for ISCAS circuits. For industrial circuits it achieves much smaller test pattern sets than other methods in designs sensitive to decision order used in ATPG.
Details
- Title: Subtitle
- A scalable method for the generation of small test sets
- Creators
- Santiago RemersaroJanusz RajskiSudhakar ReddyIrith Pomeranz
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the Conference on design, automation and test in europe, pp.1136-1141
- Publisher
- European Design and Automation Association
- Series
- DATE '09
- DOI
- 10.1109/DATE.2009.5090834
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 04/20/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197061702771
Metrics
6 Record Views