Conference proceeding
A scan BIST generation method using a Markov source and partial bit-fixing
40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, pp.554-559
2003
DOI: 10.1109/DAC.2003.1219069
Abstract
Recently, Markov sources were shown to be effective in. designing pseudo-random test pattern generators with low area overhead for built-in self-test of scan designs. This paper presents a new test pattern generation scheme based on a Markov source and a partial bit-fixing technique. A new method is proposed for the computation of the state transition probabilities of the Markov source based on the statistics of a deterministic test set. This is enhanced by partial bit-fixing logic, which fixes a group of consecutive inputs to all-0 or all-1. Experimental results show that the proposed BIST scheme can achieve 100% fault coverage for large benchmark. circuits with reduced hardware overhead and reduced pattern counts compared to the earlier method using Markov sources.
Details
- Title: Subtitle
- A scan BIST generation method using a Markov source and partial bit-fixing
- Creators
- Wei LiChaowen YuSudhakar M ReddyIrith Pomeranz
- Resource Type
- Conference proceeding
- Publication Details
- 40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, pp.554-559
- DOI
- 10.1109/DAC.2003.1219069
- Language
- English
- Date published
- 2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984231872102771
Metrics
8 Record Views