Conference proceeding
A test generation procedure for avoiding the detection of functionally redundant transition faults
24th IEEE VLSI Test Symposium, Vol.2006, pp.6 pp-299
2006
DOI: 10.1109/VTS.2006.13
Abstract
We present a test generation procedure for transition faults that minimizes the detection of functionally redundant transition faults in scan circuits. The procedure uses broadside testing. We also propose rules for identifying dominance relations between functionally redundant transition faults and functionally detectable transition faults. Dominance relations can provide two types of lower bounds. (1) A lower bound on the number of functionally detectable transition faults that cannot be detected without detecting any functionally redundant transition faults. (2) A lower bound on the number of functionally redundant faults that have to be detected if all the functionally detectable faults are detected. In our experiments with ISCAS-89 and ITC-99 benchmark circuits we achieve both of the lower bounds for almost all the circuits considered
Details
- Title: Subtitle
- A test generation procedure for avoiding the detection of functionally redundant transition faults
- Creators
- Hangkyu Lee - Purdue University West LafayetteIrith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 24th IEEE VLSI Test Symposium, Vol.2006, pp.6 pp-299
- DOI
- 10.1109/VTS.2006.13
- ISSN
- 1093-0167
- eISSN
- 2375-1053
- Publisher
- IEEE
- Language
- English
- Date published
- 2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197310202771
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