Conference proceeding
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference, pp.399-404
DAC '06
07/24/2006
DOI: 10.1145/1146909.1147015
Abstract
In this paper, we propose a test pattern ordering algorithm for fault diagnosis. Test pattern ordering is effective in situations where the fail log is truncated and contains a limited number of fail data. In such cases, higher diagnostic resolution can be achieved with the test set appropriately ordered. Test pattern ordering is independent of the diagnosis algorithm used. The higher resolution achieved by test pattern ordering is obtained at no additional cost once the test patterns have been appropriately ordered. Experimental results on two industrial designs are presented to demonstrate the effectiveness of the proposed method.
Details
- Title: Subtitle
- A test pattern ordering algorithm for diagnosis with truncated fail data
- Creators
- Gang Chen - Mentor Graphics (United States)Sudhakar Reddy - University of IowaIrith Pomeranz - Purdue University West LafayetteJanusz Rajski - Mentor Graphics (United States)
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 43rd annual Design Automation Conference, pp.399-404
- Series
- DAC '06
- DOI
- 10.1145/1146909.1147015
- ISSN
- 0738-100X
- Publisher
- ACM
- Language
- English
- Date published
- 07/24/2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197173002771
Metrics
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