Conference proceeding
Application of Saluja-Karpovsky compactors to test responses with many unknowns
Proceedings. 21st VLSI Test Symposium, 2003, Vol.2003-, pp.107-112
2003
DOI: 10.1109/VTEST.2003.1197640
Abstract
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detection and correction codes. The technique, called i-Compact, uses Saluja-Karpovsky Space Compactors, but permits detection and location of errors in the presence of unknown logic (X) values with help from the ATE. The advantages of i-Compact are: 1. Small number of output pins front the compactors for a required error detection capability; 2. Small tester memory for storing expected responses; 3. Flexibility of choosing several different combinations of number of X values and number of bit errors for error detection without altering the hardware compactor; 4. Same hardware capable of identifying the line that produced an error in presence of unknowns; 5. Use of non-proprietary codes found in the literature of 1950s; and 6. Independent of the circuit and the test generator.
Details
- Title: Subtitle
- Application of Saluja-Karpovsky compactors to test responses with many unknowns
- Creators
- J.H Patel - University of Illinois at Urbana–ChampaignS.S Lumetta - University of Illinois at Urbana–ChampaignS.M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings. 21st VLSI Test Symposium, 2003, Vol.2003-, pp.107-112
- Publisher
- IEEE
- DOI
- 10.1109/VTEST.2003.1197640
- ISSN
- 1093-0167
- eISSN
- 2375-1053
- Language
- English
- Date published
- 2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197224002771
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