Application of homing sequences to synchronous sequential circuit testing

I Pomeranz; S.M Reddy

doi:10.1109/ATS.1993.398825

Back

Conference proceeding

Application of homing sequences to synchronous sequential circuit testing

I Pomeranz and S.M Reddy

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS), pp.324-329

1993

DOI: 10.1109/ATS.1993.398825

View Online

Abstract

A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure.< >

Circuit faults

Circuit testing

Electrical fault detection

Fault detection

Sequential analysis

Sequential circuits

Synchronous generators

Details

Title: Subtitle: Application of homing sequences to synchronous sequential circuit testing
Creators: I Pomeranz - University of Iowa
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS), pp.324-329
Publisher: IEEE Comput. Soc. Press
DOI: 10.1109/ATS.1993.398825
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 1993
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197190202771

Metrics

12 Record Views