Conference proceeding
Autoscan-Invert: An Improved Scan Design without External Scan Inputs or Outputs
25th IEEE VLSI Test Symposium (VTS'07), pp.416-421
05/2007
DOI: 10.1109/VTS.2007.19
Abstract
Autoscan is a design-for-testability approach proposed earlier that uses scan chains without external scan inputs or outputs in order to reduce the test application time and test data volume of scan. We describe three improvements to the basic autoscan design-for-testability approach based on the following observation. Under autoscan, due to the elimination of external scan inputs, the first flip-flop of a scan chain can only receive its value from the corresponding next-state line. Thus, its state cannot be controlled directly by a scan operation. In the improved autoscan approach, we allow the inverted next-state line to drive the first flip-flop of a scan chain during scan operations. We refer to the improved autoscan approach as autoscan-invert. We describe a scan synthesis procedure appropriate for autoscan-invert and present experimental results.
Details
- Title: Subtitle
- Autoscan-Invert: An Improved Scan Design without External Scan Inputs or Outputs
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 25th IEEE VLSI Test Symposium (VTS'07), pp.416-421
- DOI
- 10.1109/VTS.2007.19
- ISSN
- 1093-0167
- eISSN
- 2375-1053
- Publisher
- IEEE
- Language
- English
- Date published
- 05/2007
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197347102771
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