Bridge Defect Diagnosis with Physical Information

Wei Zou; Wu-Tung Cheng; S.M Reddy

doi:10.1109/ATS.2005.32

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Conference proceeding

Bridge Defect Diagnosis with Physical Information

Wei Zou, Wu-Tung Cheng and S.M Reddy

14th Asian Test Symposium (ATS'05), Vol.2005, pp.248-253

2005

DOI: 10.1109/ATS.2005.32

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Abstract

Circuit behavior in the presence of bridge defects is affected by three factors: bridge resistance, drive strength of bridged signals and the threshold voltages of downstream gates. Current bridge defect diagnosis methods either ignore all of these factors or consider drive strengths and/or threshold voltages only. Specifically, existing diagnosis methods have not considered the effect caused by bridge resistance. So the diagnosis results from current procedures may not be as accurate as possible. In this paper, we present a bridge defect diagnosis method taking all three factors into account. Experiments conducted on benchmark circuits and one industrial design demonstrate that the proposed method can achieve a very high diagnosis accuracy and resolution.

Bridge circuits

Circuit faults

Circuit testing

CMOS technology

Integrated circuit technology

Logic

Manufacturing industries

Signal resolution

Threshold voltage

Voting

Details

Title: Subtitle: Bridge Defect Diagnosis with Physical Information
Creators: Wei Zou - University of Iowa
Wu-Tung Cheng
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 14th Asian Test Symposium (ATS'05), Vol.2005, pp.248-253
Publisher: IEEE
DOI: 10.1109/ATS.2005.32
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 2005
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197190702771

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