- Title: Subtitle
- Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences
- Creators
- Irith Pomeranz - University of IowaSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 36th annual ACM/IEEE Design Automation Conference, pp.754-759
- Publisher
- ACM
- Series
- DAC '99
- DOI
- 10.1145/309847.310052
- ISSN
- 0738-100X
- Language
- English
- Date published
- 06/01/1999
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197065502771
Conference proceeding
Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences
Proceedings of the 36th annual ACM/IEEE Design Automation Conference, pp.754-759
DAC '99
06/01/1999
DOI: 10.1145/309847.310052
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