Conference proceeding
Characterizing fabrication quality and UV performance of UV gratings
Proceedings of SPIE, the international society for optical engineering, Vol.14154, pp.141548Q-141548Q-9
08/21/2026
DOI: 10.1117/12.3104978
Abstract
Ultraviolet (UV, 90−200 nm) spectroscopy is a powerful tool for probing astrophysical systems, as it traces baryonic matter across many phases and temperatures. Achieving our future science goals will require high-performance, large-format gratings, but directly measuring their UV efficiency is costly and time-consuming. If trends between the UV performance and fabrication quality of small gratings can predict the performance of larger gratings, we can streamline the UV grating characterization process. We present results from a multiyear study assessing fabrication quality and UV performance of small gratings. We use optical interferometry to determine the gratings’ period error and limiting resolution. We use single-point metrology to measure the surface roughness. We characterize the gratings’ UV performance via efficiency measurements from 90−200 nm. We investigate correlations between fabrication metrics and UV performance, enabling metrology-based prediction of large-format grating performance.
Details
- Title: Subtitle
- Characterizing fabrication quality and UV performance of UV gratings
- Creators
- Jared A. B. Termini - Univ. of Florida (United States)Keri Hoadley - Univ. of Florida (United States)Casey DeRoo - University of IowaCecilia Fasano - U.S. Naval Research Lab. (United States)Paul Scowen - NASA Goddard Space Flight Ctr. (United States)Jacob Ward - NASA Goddard Space Flight Ctr. (United States)Manuel Quijada - NASA Goddard Space Flight Ctr. (United States)Javier Del Hoyo - NASA Goddard Space Flight Ctr. (United States)Luis Rodriguez de Marcos - Catholic University of AmericaMateo Batkis - Corning, Inc. (United States)
- Contributors
- Ramón Navarro (Editor) - Tiny Telescope (Netherlands)Ralf Jedamzik (Editor) - SCHOTT AG (Germany)
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of SPIE, the international society for optical engineering, Vol.14154, pp.141548Q-141548Q-9
- DOI
- 10.1117/12.3104978
- ISSN
- 0277-786X
- Publisher
- SPIE
- Language
- English
- Date published
- 08/21/2026
- Academic Unit
- Physics and Astronomy; University College Courses
- Record Identifier
- 9985236435602771
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