Conference proceeding
Circuit lines for guiding the generation of random test sequences for synchronous sequential circuits
Proceedings of the 2008 Asia and South Pacific Design Automation Conference, pp.641-646
ASP-DAC '08
01/21/2008
DOI: 10.1109/ASPDAC.2008.4484030
Abstract
A procedure proposed earlier for improving the fault coverage of a random primary input sequence modifies the input sequence so as to avoid repeated synchronization of state variables. We show that in addition to the values of state variables, it is also important to consider repeated setting of other lines to the same values. A procedure and experimental results are presented to demonstrate the improvements in fault coverage of random primary input sequences when the values of selected lines are considered.
Details
- Title: Subtitle
- Circuit lines for guiding the generation of random test sequences for synchronous sequential circuits
- Creators
- Irith PomeranzSudhakar Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 2008 Asia and South Pacific Design Automation Conference, pp.641-646
- Publisher
- IEEE Computer Society Press
- Series
- ASP-DAC '08
- DOI
- 10.1109/ASPDAC.2008.4484030
- ISSN
- 2153-6961
- eISSN
- 2153-697X
- Language
- English
- Date published
- 01/21/2008
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197105802771
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