Complex refractive index measurement of chalcogenide-based copolymers for infrared optics

Cory Stephenson; Justin Offolter; Jonathan C. Koerber; Darryl A. Boyd; Vinh Q. Nguyen; Daniel J. Gibson; Thomas G. Folland; Gregory T. Forcherio

doi:10.1117/12.3103055

$Complex refractive index measurement of chalcogenide-based copolymers for infrared optics$

Conference proceeding

Complex refractive index measurement of chalcogenide-based copolymers for infrared optics

Cory Stephenson, Justin Offolter, Jonathan C. Koerber, Darryl A. Boyd, Vinh Q. Nguyen, Daniel J. Gibson, Thomas G. Folland and Gregory T. Forcherio

Proceedings of SPIE, the international society for optical engineering, Vol.14034, pp.140340B-140340B-5

06/11/2026

DOI: 10.1117/12.3103055

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Abstract

Chalcogen-based copolymers potentiate a secure, domestic source of raw materials, such as Sulfur derived from petrochemical waste, that support infrared transparency viable for low-cost infrared optics. Purification of organic species in the fingerprint region from the copolymer towards high chalcogen concentrations is necessary to stretch infrared transmittance towards longer wavelengths. This work focuses on development of Fourier transform infrared (FTIR) spectroscopy-based techniques measure and extract broadband, complex refractive indices of these chalcogenide-rich copolymers and correlating the extinction coefficient, k, with specific molecular impurities.

Details

Title: Subtitle: Complex refractive index measurement of chalcogenide-based copolymers for infrared optics
Creators: Cory Stephenson - Naval Surface Warfare Center
Justin Offolter - Naval Surface Warfare Center
Jonathan C. Koerber - Naval Surface Warfare Center
Darryl A. Boyd - United States Naval Research Laboratory
Vinh Q. Nguyen - U.S. Naval Research Lab. (United States)
Daniel J. Gibson - United States Naval Research Laboratory
Thomas G. Folland - University of Iowa
Gregory T. Forcherio - Naval Surface Warfare Center
Contributors: Peter L. Marasco (Editor) - Air Force Research Lab. (United States)
Jay N. Vizgaitis (Editor) - optX Imaging Systems (United States)
Daniel J. Gibson (Editor) - United States Naval Research Laboratory
Resource Type: Conference proceeding
Publication Details: Proceedings of SPIE, the international society for optical engineering, Vol.14034, pp.140340B-140340B-5
DOI: 10.1117/12.3103055
ISSN: 0277-786X
Publisher: SPIE
Language: English
Date published: 06/11/2026
Academic Unit: Physics and Astronomy
Record Identifier: 9985180967802771

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