- Title: Subtitle
- Concurrent on-line testing of identical circuits through output comparison using non-identical input vectors
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, pp.469-476
- Conference
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 19th (Cannes, France, 10/10/2004–10/13/2004)
- DOI
- 10.1109/DFTVS.2004.1347872
- ISSN
- 1550-5774
- eISSN
- 2377-7966
- Publisher
- IEEE
- Language
- English
- Date published
- 2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197288402771
Conference proceeding
Concurrent on-line testing of identical circuits through output comparison using non-identical input vectors
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, pp.469-476
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 19th (Cannes, France, 10/10/2004–10/13/2004)
2004
DOI: 10.1109/DFTVS.2004.1347872
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