Conflict driven techniques for improving deterministic test pattern generation

Conference proceeding

CHEN Wang, Sudhakar M Reddy, Irith Pomeranz, XIJIANG Lin and Janusz Rajski

Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design, pp.87-93

ICCAD-2002 : IEEE/ACM international conference on computer aided design (San Jose CA, 10-14 November 2002)

2002

DOI: 10.1145/774572.774585

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Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: Conflict driven techniques for improving deterministic test pattern generation
Creators: CHEN Wang - University of Iowa
Sudhakar M Reddy - University of Iowa
Irith Pomeranz - Purdue University West Lafayette
XIJIANG Lin - Mentor Graphics (United States)
Janusz Rajski - Mentor Graphics (United States)
Resource Type: Conference proceeding
Publication Details: Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design, pp.87-93
Conference: ICCAD-2002 : IEEE/ACM international conference on computer aided design (San Jose CA, 10-14 November 2002)
DOI: 10.1145/774572.774585
ISSN: 1092-3152
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197442102771

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