Convolutional compaction of test responses

Conference proceeding

Janusz Rajski, Jerzy Tyszer, Chen Wang and Sudhakar M Reddy

International Test Conference, 2003. Proceedings. ITC 2003, Vol.1, pp.745-754

International Test Conference (ITC) (Charlotte, North Carolina, 09/30/2003–10/02/2003)

2003

DOI: 10.1109/TEST.2003.1270904

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Built-in self-test

Circuit faults

Circuit testing

Cities and towns

Compaction

Electronics industry

Graphics

Integrated circuit testing

Moore's Law

Semiconductor device testing

Title: Subtitle: Convolutional compaction of test responses
Creators: Janusz Rajski
Jerzy Tyszer
Chen Wang
Sudhakar M Reddy
Resource Type: Conference proceeding
Publication Details: International Test Conference, 2003. Proceedings. ITC 2003, Vol.1, pp.745-754
Conference: International Test Conference (ITC) (Charlotte, North Carolina, 09/30/2003–10/02/2003)
DOI: 10.1109/TEST.2003.1270904
ISSN: 1089-3539
eISSN: 2378-2250
Publisher: IEEE
Language: English
Date published: 2003
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198018902771

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