Conference proceeding
Defect Aware Test Patterns
Proceedings of the conference on design, automation and test in europe, Vol.1, pp.450-455
DATE '05
03/07/2005
DOI: 10.1109/DATE.2005.110
Abstract
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.
Details
- Title: Subtitle
- Defect Aware Test Patterns
- Creators
- Huaxing Tang - University of IowaGang Chen - University of IowaSudhakar Reddy - University of IowaChen Wang - Mentor Graphics (United States)Janusz Rajski - Mentor Graphics (United States)Irith Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on design, automation and test in europe, Vol.1, pp.450-455
- Series
- DATE '05
- DOI
- 10.1109/DATE.2005.110
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Publisher
- IEEE Computer Society
- Language
- English
- Date published
- 03/07/2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197175702771
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