- Title: Subtitle
- Defect diagnosis based on pattern-dependent stuck-at faults
- Creators
- Irith Pomeranz - Purdue University West LafayetteSrikanth Venkataraman - Intel Corporation, Hillsboro, OR 97124, United StatesSudhakar M Reddy - University of IowaEnamul Amyeen - Enamul Amyeen, Intel Corporation, Hillsboro, OR 97124, United States
- Resource Type
- Conference proceeding
- Publication Details
- 17th International Conference on VLSI Design. Proceedings, pp.475-480
- Conference
- International Conference on VLSI Design, 17 (Mumbai, India, 01/09/2004)
- DOI
- 10.1109/ICVD.2004.1260966
- Publisher
- IEEE Computer Society
- Language
- English
- Date published
- 2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198018802771
Conference proceeding
Defect diagnosis based on pattern-dependent stuck-at faults
17th International Conference on VLSI Design. Proceedings, pp.475-480
International Conference on VLSI Design, 17 (Mumbai, India, 01/09/2004)
2004
DOI: 10.1109/ICVD.2004.1260966
Abstract
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