Conference proceeding
Definition and application of approximate necessary assignments
Proceedings of the 19th ACM Great Lakes symposium on vlsi, pp.105-108
GLSVLSI '09
05/10/2009
DOI: 10.1145/1531542.1531569
Abstract
A necessary assignment for a fault f is a line value that must be assigned by a test vector that detects f. A higher number of necessary assignments translates into a lower test generation effort since the test generation process has a larger number of values that it must assign, and therefore, fewer options that it can explore. To increase the number of available necessary assignments, we define approximate necessary assignments as line values that are assigned by most of the test vectors for a fault. We describe a heuristic procedure for computing approximate necessary assignments for inputs and demonstrate their effectiveness in reducing the test generation effort of a random test generation process.
Details
- Title: Subtitle
- Definition and application of approximate necessary assignments
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 19th ACM Great Lakes symposium on vlsi, pp.105-108
- Series
- GLSVLSI '09
- DOI
- 10.1145/1531542.1531569
- Publisher
- ACM
- Language
- English
- Date published
- 05/10/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197447102771
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