Conference proceeding
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, pp.394-402
10/2008
DOI: 10.1109/DFT.2008.11
Abstract
In many designs asynchronous inputs are used to set and/or reset flip-flops. Considering a scan cell implementation used in an industrial design we show that stuck-open faults in some transistors driven by asynchronous inputs require two new flush tests. Such faults, if left undetected, cause functional failures. The two new tests increase the overall stuck-open fault coverage of each scan cell by approximately 5%. This will significantly improve the overall test quality due to the large number of scan cells contained in large industrial designs.
Details
- Title: Subtitle
- Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells
- Creators
- Fan Yang - University of IowaSreejit Chakravarty - LSI CorporationNarendra Devta-Prasanna - LSI Corp., Milpitas, CASudhakar M Reddy - University of IowaIrith Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, pp.394-402
- DOI
- 10.1109/DFT.2008.11
- ISSN
- 1550-5774
- eISSN
- 2377-7966
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2008
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197452602771
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