Deterministic Stellar BIST for In-System Automotive Test

Yingdi Liu; Nilanjan Mukherjee; Janusz Rajski; Sudhakar M Reddy; Jerzy Tyszer

doi:10.1109/TEST.2018.8624872

Back

Conference proceeding

Deterministic Stellar BIST for In-System Automotive Test

Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M Reddy and Jerzy Tyszer

2018 IEEE International Test Conference (ITC), Vol.2018-, pp.1-9

10/2018

DOI: 10.1109/TEST.2018.8624872

View Online

Abstract

With the growing number of very complex safety-critical components used in advanced driver assistance systems and autonomous vehicles, integrated circuits in this area must adhere to stringent requirements for high quality and long-term reliability driven by functional safety standards. This, in turn, requires advanced test solutions that have to respond to challenges posed by automotive parts. This paper presents Stellar BIST - a deterministic two-level compression scheme for in-system automotive test. The proposed solution seamlessly integrates with any sequential test compression scheme and takes advantage of the fact that certain clusters of test vectors detect many random-resistant faults where a cluster consists of a parent pattern and its transformed derivatives. Stellar BIST involves generating vectors based on simultaneous and multiple complements of scan slices of encodable parent patterns. The multiple complements are also skewed between successive patterns to diversify the resultant tests. The new scheme elevates compression to values unachievable through conventional reseeding-based solutions and provides significant trade-offs between area and time, critical for in-system automotive applications. Experimental results obtained for large industrial designs with stuck-at and transition faults illustrate feasibility of the proposed test scheme and are reported herein.

Automotive Engineering

Integrated Circuits

Safety

automotive embedded test

Built-in self-test

Circuit faults

functional safety

Registers

Reliability

scan-based testing

test application time

test data compression

Details

Title: Subtitle: Deterministic Stellar BIST for In-System Automotive Test
Creators: Yingdi Liu - University of Iowa
Nilanjan Mukherjee - Mentor Graphics
Janusz Rajski - Mentor Graphics
Sudhakar M Reddy - University of Iowa
Jerzy Tyszer - Poznań University of Technology
Resource Type: Conference proceeding
Publication Details: 2018 IEEE International Test Conference (ITC), Vol.2018-, pp.1-9
DOI: 10.1109/TEST.2018.8624872
ISSN: 1089-3539
eISSN: 2378-2250
Publisher: IEEE
Language: English
Date published: 10/2018
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197324002771

Metrics

15 Record Views