Development for a metrology system for the Arcus MIDEX mission

Jacob Hohl; Peter Cheimets; Casey DeRoo; Edward Hertz; H. Moritz Gunther; Kristin Madsen; Jenna Samra; Alan Schier; Randall Smith; Stephen Walker

doi:10.1117/12.2594671

Conference proceeding

Development for a metrology system for the Arcus MIDEX mission

Jacob Hohl, Peter Cheimets, Casey DeRoo, Edward Hertz, H. Moritz Gunther, Kristin Madsen, Jenna Samra, Alan Schier, Randall Smith and Stephen Walker

UV, X-RAY, AND GAMMA-RAY SPACE INSTRUMENTATION FOR ASTRONOMY XXII, Vol.11821, pp.1182107-1182107-8

Proceedings of SPIE

01/01/2021

DOI: 10.1117/12.2594671

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Abstract

Arcus is an innovative MIDEX-class photon-counting X-ray spectroscopy mission. Due to the nature of the sources that Arcus will focus on, observations can be many tens of kiloseconds (ks) long. The resulting spectral images are reconstructed on the ground to remove measured pointing and instrument deflection effects that take place over that time, achieving a higher resolution than would be possible without removing these effects. Arcus's 12 m focal length grazing incidence optics are separated from the detectors by a 10.8 m long by circle divide 1.85 m, on-orbit deployable boom. This paper describes an implementation of an internal aspect sensor that uses flight tested commercial off the shelf (COTS) components to measure linear deflection from one end of that boom to the other to achieve a better than 22 micron resolution (3 sigma) correction for that motion, meeting the required performance that Arcus needs to maintain its achieve its imaging resolution.

Astronomy & Astrophysics

Instruments & Instrumentation

Optics

Physical Sciences

Science & Technology

Technology

Details

Title: Subtitle: Development for a metrology system for the Arcus MIDEX mission
Creators: Jacob Hohl - Center for Astrophysics Harvard & Smithsonian
Peter Cheimets - Center for Astrophysics Harvard & Smithsonian
Casey DeRoo - University of Iowa
Edward Hertz - Center for Astrophysics Harvard & Smithsonian
H. Moritz Gunther - MIT, 77 Massachusetts Ave, Cambridge, MA 02139 USA
Kristin Madsen - University of Maryland, Baltimore County
Jenna Samra - Center for Astrophysics Harvard & Smithsonian
Alan Schier - The Pilot Group (United States)
Randall Smith - Center for Astrophysics Harvard & Smithsonian
Stephen Walker - Ames Research Center
Contributors: O H Siegmund (Editor)
Resource Type: Conference proceeding
Publication Details: UV, X-RAY, AND GAMMA-RAY SPACE INSTRUMENTATION FOR ASTRONOMY XXII, Vol.11821, pp.1182107-1182107-8
Publisher: Spie-Int Soc Optical Engineering
Series: Proceedings of SPIE
DOI: 10.1117/12.2594671
ISSN: 0277-786X
eISSN: 1996-756X
Number of pages: 8
Language: English
Date published: 01/01/2021
Academic Unit: Physics and Astronomy; University College Courses
Record Identifier: 9984428824902771

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