Conference proceeding
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.217-225
10/2011
DOI: 10.1109/DFT.2011.37
Abstract
In this work, new techniques are proposed to improve diagnosis of multiple faults based on fault-tuple equivalence tree (FTET). After carefully analyzing relations between faults in FTET, the concept of conflicts is proposed and utilized to locate the faulty sites. The proposed diagnosis algorithm can accurately identify the defect locations and also identify the physical fault types, which was demonstrated by experimental results on large ISCAS89 and ITC99 circuits.
Details
- Title: Subtitle
- Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree
- Creators
- Xun Tang - University of IowaWu-Tung Cheng - Mentor GraphicsRuifeng Guo - Mentor GraphicsHuaxing Tang - Mentor GraphicsSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.217-225
- DOI
- 10.1109/DFT.2011.37
- ISSN
- 1550-5774
- eISSN
- 2377-7966
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197443902771
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