Conference proceeding
Diagnosis of Multiple Physical Defects Using Logic Fault Models
2010 19th IEEE Asian Test Symposium, pp.94-99
12/2010
DOI: 10.1109/ATS.2010.25
Abstract
In this work, we propose a method to improve diagnosis results when multiple physical defects are present in circuits under diagnosis. To improve diagnosis results when multiple defects are present in a circuit under diagnosis, the proposed method includes (i) analyzing relations among locations of logic faults and their diagnostic metrics to carefully derive physical faults, (ii) a new set covering procedure and (iii) a method to assign scores to faults to derive candidate sets of faults. Experimental results on several industrial designs and several cases of silicon defects show the effectiveness of the proposed diagnosis method.
Details
- Title: Subtitle
- Diagnosis of Multiple Physical Defects Using Logic Fault Models
- Creators
- Xun Tang - University of IowaWu-Tung Cheng - Mentor GraphicsRuifeng Guo - Mentor GraphicsS M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 2010 19th IEEE Asian Test Symposium, pp.94-99
- DOI
- 10.1109/ATS.2010.25
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Publisher
- IEEE
- Language
- English
- Date published
- 12/2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197416702771
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