Diagnostic Test Generation Based on Subsets of Faults

I Pomeranz; S.M Reddy

doi:10.1109/ETS.2007.17

Back

Conference proceeding

Diagnostic Test Generation Based on Subsets of Faults

I Pomeranz and S.M Reddy

12th IEEE European Test Symposium (ETS'07), pp.151-158

05/2007

DOI: 10.1109/ETS.2007.17

View Online

Abstract

We describe a diagnostic test generation procedure that deals with the large numbers of target fault pairs by considering subsets of faults. Each subset of faults is targeted separately during diagnostic test generation, and fault pairs are defined only out of the faults included in a subset. With M subsets of size K, the number of fault pairs considered is at most MK(K-1)/2 instead of N(N-1)/2 for a circuit with N target faults. Fault subsets can be defined using information about faults that are likely to be difficult or important to distinguish. In this work, fault subsets are defined based on structural analysis of the circuit.

Bridge circuits

Circuit analysis

Circuit faults

Circuit simulation

Circuit testing

Cities and towns

Data structures

Electrical fault detection

Fault detection

Fault diagnosis

Details

Title: Subtitle: Diagnostic Test Generation Based on Subsets of Faults
Creators: I Pomeranz - Purdue University West Lafayette
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 12th IEEE European Test Symposium (ETS'07), pp.151-158
DOI: 10.1109/ETS.2007.17
ISSN: 1530-1877
eISSN: 1558-1780
Publisher: IEEE
Language: English
Date published: 05/2007
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197435702771

Metrics

23 Record Views