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Direct Measure of Strain and Electronic Structure in GaAs/GaP Core-Shell Nanowires
Conference proceeding   Peer reviewed

Direct Measure of Strain and Electronic Structure in GaAs/GaP Core-Shell Nanowires

H. E. Jackson, M. Montazeri, M. Fickenscher, L. M. Smith, J. M. Yarrison-Rice, J. H. Kang, Q. Gao, H. H. Tan, C. Jagadish, Y. Guo, …
PHYSICS OF SEMICONDUCTORS: 30TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, Vol.1399(1), pp.477-478
AIP Conference Proceedings
01/01/2011
DOI: 10.1063/1.3666461

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Abstract

Engineering Engineering, Electrical & Electronic Physical Sciences Physics Physics, Applied Science & Technology Technology

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