Distributed dynamic partitioning based diagnosis of scan chain

Yu Huang; Xiaoxin Fan; Huaxing Tang; M Sharma; Wu-Tung Cheng; B Benware; S. M Reddy

doi:10.1109/VTS.2013.6548916

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Conference proceeding

Distributed dynamic partitioning based diagnosis of scan chain

Yu Huang, Xiaoxin Fan, Huaxing Tang, M Sharma, Wu-Tung Cheng, B Benware and S. M Reddy

2013 IEEE 31st VLSI Test Symposium (VTS), pp.1-6

04/2013

DOI: 10.1109/VTS.2013.6548916

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Abstract

Diagnosis memory footprint for large designs is growing as design sizes grow such that the diagnosis throughput for given computational resources becomes a bottleneck in volume diagnosis. In this paper, we propose a scan chain diagnosis flow based on dynamic design partitioning and distributed diagnosis architecture that can improve the diagnosis throughput over one order of magnitude.

Computer Architecture

Accuracy

Circuit faults

Heuristic algorithms

Logic gates

Throughput

Details

Title: Subtitle: Distributed dynamic partitioning based diagnosis of scan chain
Creators: Yu Huang - Mentor Graphics
Xiaoxin Fan - University of Iowa
Huaxing Tang - Mentor Graphics
M Sharma - Mentor Graphics
Wu-Tung Cheng - Mentor Graphics
B Benware - Mentor Graphics
S. M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 2013 IEEE 31st VLSI Test Symposium (VTS), pp.1-6
DOI: 10.1109/VTS.2013.6548916
ISSN: 1093-0167
eISSN: 2375-1053
Publisher: IEEE
Language: English
Date published: 04/2013
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197216102771

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