Dominance based analysis for large volume production fail diagnosis

B Seshadri; I Pomeranz; S Venkataraman; M.E Amyeen; S.M Reddy

doi:10.1109/VTS.2006.29

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Conference proceeding

Dominance based analysis for large volume production fail diagnosis

B Seshadri, I Pomeranz, S Venkataraman, M.E Amyeen and S.M Reddy

24th IEEE VLSI Test Symposium, Vol.2006, pp.6 pp-399

2006

DOI: 10.1109/VTS.2006.29

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Abstract

A procedure for using fault dominance in a large volume diagnosis environment is described. Fault dominance is shown to be useful for reducing the fault simulation time during diagnosis when used together with the concept of pattern dependence and maximally dominating faults. Results for both ISCAS benchmarks and industrial circuits are reported. The results show 9 % to 44% average reduction in the fault simulation time for these circuits

Failure Analysis

Automatic test pattern generation

Circuit faults

Circuit simulation

Circuit testing

Fault detection

Fault diagnosis

Logic testing

Production systems

System testing

Details

Title: Subtitle: Dominance based analysis for large volume production fail diagnosis
Creators: B Seshadri - Purdue University West Lafayette
I Pomeranz - Purdue University West Lafayette
S Venkataraman - Intel (United States)
M.E Amyeen - Intel
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 24th IEEE VLSI Test Symposium, Vol.2006, pp.6 pp-399
DOI: 10.1109/VTS.2006.29
ISSN: 1093-0167
eISSN: 2375-1053
Publisher: IEEE
Language: English
Date published: 2006
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197442202771

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