Conference proceeding
Don't Care Identification and Statistical Encoding for Test Data Compression
IEICE transactions on information and systems. (Special Section on Test and Verification of VLSI), Vol.87(3), pp.544-550
03/01/2004
Abstract
This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified input values in the test set to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method can on the average reduce the test data volume to less than 25% of that required for the original test set.
Details
- Title: Subtitle
- Don't Care Identification and Statistical Encoding for Test Data Compression
- Creators
- Seiji KajiharaKenjiro TaniguchiKohei MiyaseIrith PomeranzSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- IEICE transactions on information and systems. (Special Section on Test and Verification of VLSI), Vol.87(3), pp.544-550
- Publisher
- 一般社団法人電子情報通信学会
- ISSN
- 0916-8532
- eISSN
- 1745-1361
- Language
- English
- Date published
- 03/01/2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197905302771
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