Don't-care identification on specific bits of test patterns

Conference proceeding

Kohei Miyase, Seiji Kajihara, Irith Pomeranz and Sudhakar M Reddy

Proceedings, IEEE International Conference on Computer Design, pp.194-199

ICCD'2002 : IEEE international conference on computer design : VLSI in computers and processors (Freiburg, 16-18 September 2002)

2002

DOI: 10.1109/ICCD.2002.1106769

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Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Title: Subtitle: Don't-care identification on specific bits of test patterns
Creators: Kohei Miyase - Graduate Sch. of Comput. Sci. & Syst. Eng., Kyusyu Inst. of Technol., Japan
Seiji Kajihara - Graduate Sch. of Comput. Sci. & Syst. Eng., Kyusyu Inst. of Technol., Japan
Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings, IEEE International Conference on Computer Design, pp.194-199
Conference: ICCD'2002 : IEEE international conference on computer design : VLSI in computers and processors (Freiburg, 16-18 September 2002)
DOI: 10.1109/ICCD.2002.1106769
ISSN: 1063-6404
eISSN: 2576-6996
Publisher: IEEE
Grant note: IEEE Circuits and Systems Society IEEE Computer Society; Technical Committee on Design Automation
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197553502771

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