Conference proceeding
Dynamic test compaction for a random test generation procedure with input cube avoidance
Proceedings of the 2009 Asia and South Pacific Design Automation Conference, pp.672-677
ASP-DAC '09
01/19/2009
DOI: 10.1109/ASPDAC.2009.4796557
Abstract
A recent approach to test generation avoids the assignment of certain input values in order not to prevent target faults from being detected. The test generation process based on this approach is efficient; however, it generates large test sets. We develop a dynamic test compaction procedure for this approach. Our goal is to reduce the test set size by increasing the number of faults detected by each test vector, while keeping the computational complexity as low as that of the original procedure. This is achieved by avoiding the assignment of certain input values in order not to prevent subsets of faults from being detected.
Details
- Title: Subtitle
- Dynamic test compaction for a random test generation procedure with input cube avoidance
- Creators
- Irith PomeranzSudhakar Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 2009 Asia and South Pacific Design Automation Conference, pp.672-677
- Publisher
- IEEE Press
- Series
- ASP-DAC '09
- DOI
- 10.1109/ASPDAC.2009.4796557
- ISSN
- 2153-6961
- eISSN
- 2153-697X
- Language
- English
- Date published
- 01/19/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197556502771
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