Conference proceeding
Dynamic test compaction for bridging faults
Sixth international symposium on quality electronic design (isqed'05), pp.250-255
2005
DOI: 10.1109/ISQED.2005.48
Abstract
We describe a dynamic test compaction procedure for four-way bridging faults. Under this fault model, a pair of lines g/sub i/, g/sub j/ is associated with four bridging faults corresponding to two possible combinations of opposite values on g/sub i/ and g/sub j/, and two options for the line whose value is faulty in the presence of the fault (either g/sub i/ or g/sub j/). Compaction is achieved by simultaneously considering faults that have a line g/sub i/ with a value /spl alpha//sub i/ in common, such that the value /spl alpha//sub i/ on g/sub i/ is affected by the presence of the fault. Faults with a common line g/sub i/ and value /spl alpha//sub i/ differ only in the second line g/sub j/ of each pair of bridged lines, and the second lines only need to be assigned the value /spl alpha/~/sub i/ in order to detect all the faults. This strong relationship between the faults allows us to derive tests that detect large numbers of these faults, resulting in compact test sets.
Details
- Title: Subtitle
- Dynamic test compaction for bridging faults
- Creators
- I Pomeranz - Purdue University West LafayetteS.A Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Sixth international symposium on quality electronic design (isqed'05), pp.250-255
- DOI
- 10.1109/ISQED.2005.48
- ISSN
- 1948-3287
- eISSN
- 1948-3295
- Publisher
- IEEE
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197178602771
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