Conference proceeding
Effect of waveguide side-wall roughness on the performance of quantum cascade lasers
Proceedings of SPIE, Vol.7230(1), pp.72301P-72301P-10
Novel In-Plane Semiconductor Lasers VIII
02/12/2009
DOI: 10.1117/12.808227
Abstract
We report on a study to determine the effect of waveguide side-wall roughness on Quantum Cascade (QC) laser performance, such as threshold current density, slope efficiency, far-field beam pattern and group refractive index, using two two-wavelength heterogeneous cascade QC laser structures, one with emission wavelengths of 7.0 m/11.2 m, and the other with 8.7 m /12.0 m. For the range of roughness standard deviation values from about 0.4 m to 1.0 m for which all four QC lasers were operating, the threshold current density increases by 12%-15% and the slope efficiency decreases by 30%-70% with stronger performance degradation for the shorter wavelength lasers, which is in agreement with a model based on Rayleigh scattering. Moreover, no significant change in the far-field beam patterns for different
values was observed, and the group effective index values of the four wavelengths have several values for each rough waveguide indicative of multiple transverse modes in the waveguides.
Details
- Title: Subtitle
- Effect of waveguide side-wall roughness on the performance of quantum cascade lasers
- Creators
- Fatima Toor - Princeton UniversityDeborah L Sivco - Alcatel LucentClaire F Gmachl - Princeton University
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of SPIE, Vol.7230(1), pp.72301P-72301P-10
- Conference
- Novel In-Plane Semiconductor Lasers VIII
- DOI
- 10.1117/12.808227
- ISSN
- 0277-786X
- Language
- English
- Date published
- 02/12/2009
- Academic Unit
- Physics and Astronomy; Electrical and Computer Engineering; Iowa Technology Institute; Holden Comprehensive Cancer Center
- Record Identifier
- 9984197108002771
Metrics
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