Conference proceeding
Efficient Prognostication of Pattern Count with Different Input Compression Ratios
2020 IEEE European Test Symposium (ETS), Vol.2020-, pp.1-2
05/2020
DOI: 10.1109/ETS48528.2020.9131586
Abstract
A novel method to efficiently and accurately prognosticate the pattern count at different input compression ratios with the Embedded Deterministic Test (EDT) compression technology is proposed. With this method the total ATPG run time can be significantly reduced compared to the currently used trial-and-error method.
Details
- Title: Subtitle
- Efficient Prognostication of Pattern Count with Different Input Compression Ratios
- Creators
- Fong-Jyun Tsai - National Cheng Kung UniversityChong-Siao Ye - National Cheng Kung UniversityYu Huang - Mentor GraphicsKuen-Jong Lee - National Cheng Kung UniversityWu-Tung Cheng - Mentor GraphicsSudhakar M Reddy - University of IowaMark Kassab - Mentor GraphicsJanusz Rajski - Mentor Graphics
- Resource Type
- Conference proceeding
- Publication Details
- 2020 IEEE European Test Symposium (ETS), Vol.2020-, pp.1-2
- DOI
- 10.1109/ETS48528.2020.9131586
- ISSN
- 1530-1877
- eISSN
- 1558-1780
- Publisher
- IEEE
- Language
- English
- Date published
- 05/2020
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197322602771
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