Conference proceeding
Efficient SAT-based generation of hazard-activated TSOF tests
2017 IEEE 35th VLSI Test Symposium (VTS), pp.1-6
VLSI Test Symposium (VTS), 35 (Las Vegas, Nevada, 04/09/2017–04/12/2017)
04/2017
DOI: 10.1109/VTS.2017.7928943
Abstract
With an increasing number of complex cells in today's VLSI designs, intra-gate opens are becoming a larger and larger problem. Typically, these defects are modeled by transistor stuck-off faults (TSOF) and assumed to be detected by transition delay fault (TDF) timing tests. However, tests for TDF fail to detect a high percentage of TSOFs and even tools that target them directly are not sufficient to screen all open defects. This is because CMOS circuits experience a large number of hazards during circuit inputs switching which are not modeled by classical tools. Hazards may activate some TSO faults considered untestable by classical ATPGs. The generation of tests that target such hazard activated opens can result in a very significant DPPM improvement - if used. In this paper, we present the first deterministic methodology for targeting hazard activated opens. It is based on a waveform-accurate SAT-based modeling and allows to accurately determine if a TSOF is detectable by hazard activation - or not. In addition, we provide a thorough investigation of the additionally achievable fault coverage using the state-of-the-art NanGate 45nm as well as NanGate 15nm cell libraries.
Details
- Title: Subtitle
- Efficient SAT-based generation of hazard-activated TSOF tests
- Creators
- Jan Burchard - University of FreiburgDominik Erb - University of FreiburgSudhakar M Reddy - University of IowaAdit D Singh - Auburn UniversityBernd Becker - University of Freiburg
- Resource Type
- Conference proceeding
- Publication Details
- 2017 IEEE 35th VLSI Test Symposium (VTS), pp.1-6
- Conference
- VLSI Test Symposium (VTS), 35 (Las Vegas, Nevada, 04/09/2017–04/12/2017)
- DOI
- 10.1109/VTS.2017.7928943
- eISSN
- 2375-1053
- Publisher
- IEEE
- Language
- English
- Date published
- 04/2017
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198009002771
Metrics
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