Conference proceeding
Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels
2020 IEEE International Test Conference in Asia (ITC-Asia), pp.130-135
09/2020
DOI: 10.1109/ITC-Asia51099.2020.00034
Abstract
Over the past two decades, test data compression has become a de facto technology used in large industrial designs to reduce the overall test cost. During DFT planning, it is very important to understand the impact of using different numbers of input/output channels on test coverage, test cycles, and test data volume. In this paper, an efficient method to estimate the test data volume with different input channel counts using the Embedded Deterministic Test (EDT) compression technology is proposed. The results can then be used to quickly determine the scan configuration that results in the least or near least test data volume. With this method, the total ATPG run time can be reduced by a factor of more than 10X compared to the currently used trial-and-error method.
Details
- Title: Subtitle
- Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels
- Creators
- Fong-Jyun Tsai - National Cheng Kung UniversityChong-Siao Ye - National Cheng Kung UniversityYu Huang - Mentor Graphics (United States)Kuen-Jong Lee - National Cheng Kung UniversityWu-Tung Cheng - Mentor Graphics (United States)Sudhakar M Reddy - University of IowaMark Kassab - Mentor Graphics (United States)Janusz Rajski - Mentor Graphics (United States)Shi-Xuan Zheng - National Cheng Kung University
- Resource Type
- Conference proceeding
- Publication Details
- 2020 IEEE International Test Conference in Asia (ITC-Asia), pp.130-135
- DOI
- 10.1109/ITC-Asia51099.2020.00034
- Publisher
- IEEE
- Language
- English
- Date published
- 09/2020
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197282402771
Metrics
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