Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST

Conference proceeding

Ilia Polian, Bernd Becker and Sudhakar Reddy

Proceedings of the conference on design, automation and test in europe, Vol.1, pp.11184-1185

DATE '03

03/03/2003

DOI: 10.1109/DATE.2003.1253792

View Online

Title: Subtitle: Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST
Creators: Ilia Polian
Bernd Becker
Sudhakar Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings of the conference on design, automation and test in europe, Vol.1, pp.11184-1185
Publisher: IEEE Computer Society
Series: DATE '03
DOI: 10.1109/DATE.2003.1253792
ISSN: 1530-1591
eISSN: 1558-1101
Language: English
Date published: 03/03/2003
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197346502771

5 Record Views