Experimental results of forward-looking reverse order fault simulation on industrial circuits with scan

Irith Pomeranz; Sudhakar M Reddy; Xijiang Lin

doi:10.1109/ATS.2001.990334

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Conference proceeding

Experimental results of forward-looking reverse order fault simulation on industrial circuits with scan

Irith Pomeranz, Sudhakar M Reddy and Xijiang Lin

Proceedings 10th Asian Test Symposium, p.467

2001

DOI: 10.1109/ATS.2001.990334

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Abstract

Discusses an improved procedure named forward-looking fault simulation. The term forward-looking refers to the fact that certain tests are dropped because they are not necessary for detecting faults that will be detected later in the simulation process. The authors discuss an efficient implementation of forward-looking fault simulation in an industrial environment. They concentrate on reverse order fault simulation. Parallel pattern single fault propagation (PPSFP) simulation is used throughout the implementation of the forward-looking reverse order fault simulation process, since PPSFP is known to result in fast fault simulation for industrial circuits.

Circuit faults

Circuit simulation

Circuit testing

Cities and towns

Computational modeling

Computer simulation

Electrical fault detection

Fault detection

Fault diagnosis

Graphics

Details

Title: Subtitle: Experimental results of forward-looking reverse order fault simulation on industrial circuits with scan
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy
Xijiang Lin
Resource Type: Conference proceeding
Publication Details: Proceedings 10th Asian Test Symposium, p.467
DOI: 10.1109/ATS.2001.990334
ISSN: 1081-7735
eISSN: 2377-5386
Publisher: IEEE
Language: English
Date published: 2001
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197456202771

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