Fast Identification of Robust Dependent Path Delay Faults

Uwe Sparmann; D Luxenburger; Kwang-Ting (Tim) Cheng; Sudhakar Mannapuram Reddy

doi:10.1145/217474.217517

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Conference proceeding

Fast Identification of Robust Dependent Path Delay Faults

Uwe Sparmann, D Luxenburger, Kwang-Ting (Tim) Cheng and Sudhakar Mannapuram Reddy

32nd Design Automation Conference, pp.119-125

1995

DOI: 10.1145/217474.217517

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Abstract

Recently, it has been shown in [1] and [2] that in order to verify the correct timing of a manufactured circuit not all of its paths need to be considered for delay testing. In this paper, a theory is developed which puts the work of these papers into a common framework, thus allowing for a better understanding of their relation. In addition, we consider the computational problem of identifying large sets of such not-necessary-to-test paths. Since the approach of [1] can only be applied for small scale circuits, we develop a new algorithm which trades quality of the result against computation time, and allows handling of large circuits with tens of millions of paths. Experimental results show that enormous improvements in running time are only paid for by a small decrease in quality.

Computer Science

Circuit faults

Circuit testing

Computer aided manufacturing

Delay

Digital circuits

Fault diagnosis

Logic testing

Robustness

Timing

Details

Title: Subtitle: Fast Identification of Robust Dependent Path Delay Faults
Creators: Uwe Sparmann - Saarland University
D Luxenburger - Saarland University
Kwang-Ting (Tim) Cheng - University of California, Santa Barbara
Sudhakar Mannapuram Reddy - University of Iowa, Electrical and Computer Engineering
Resource Type: Conference proceeding
Publication Details: 32nd Design Automation Conference, pp.119-125
Publisher: ACM
DOI: 10.1145/217474.217517
ISSN: 0738-100X
Language: English
Date published: 1995
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197450502771

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