Fault Detection by Output Response Comparison of Identical Circuits Using Half-Frequency Compatible Sequences

Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/TEST.2006.297658

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Conference proceeding

Fault Detection by Output Response Comparison of Identical Circuits Using Half-Frequency Compatible Sequences

Irith Pomeranz and Sudhakar M Reddy

2006 IEEE International Test Conference, pp.1-10

10/2006

DOI: 10.1109/TEST.2006.297658

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Abstract

When multiple copies of the same functional unit are available in a design, fault detection can be achieved by comparing the output responses of two copies (or two identical circuits). This obviates the need for storing test responses or for computing signatures of test responses. The paper proposes the testing of identical circuits using a deterministic test sequence by running the circuits at different speeds. This allows the detection of delay faults even if the two copies are affected by similar faults. The proposed method is particularly suitable in applications where functional sequences are used to bin products or to detect delay faults. The case where one of the copies is run at the full circuit speed while the other copy is run at half the full frequency was considered. To allow output response comparison under these conditions, a procedure for designing an input sequence that produces identical output vectors from the two copies every second time unit was described, assuming that both copies are fault free. It was shown that the existence of such input sequences depends on the initial state. Moreover, it is advantageous to start the two copies from different initial states. Experimental results show that very high fault coverage can be achieved by using such sequences

Circuit faults

Circuit testing

Cities and towns

Compaction

Concurrent computing

Delay

Design methodology

Electrical fault detection

Fault detection

Frequency

Details

Title: Subtitle: Fault Detection by Output Response Comparison of Identical Circuits Using Half-Frequency Compatible Sequences
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 2006 IEEE International Test Conference, pp.1-10
DOI: 10.1109/TEST.2006.297658
ISSN: 1089-3539
eISSN: 2378-2250
Publisher: IEEE
Language: English
Date published: 10/2006
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197222302771

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