Fault diagnosis aware ATE assisted test response compaction

J M Howard; S M Reddy; I Pomeranz; B Becker

doi:10.1109/ASPDAC.2011.5722302

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Conference proceeding

Fault diagnosis aware ATE assisted test response compaction

J M Howard, S M Reddy, I Pomeranz and B Becker

16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011), pp.812-817

01/2011

DOI: 10.1109/ASPDAC.2011.5722302

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Abstract

Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve additional compaction, without compromising fault coverage, beyond what may already be achieved using on-chip response compactors. The method does not add additional logic or modify the circuit under test or require additional tests and thus can be used with any design including legacy designs. In this work, we enhance this method so that the level of diagnostic resolution achieved without it can be maintained. Experimental results on larger ISCAS-89 show that additional test response compaction can be achieved while diagnostic resolution for single and double stuck-at faults is not adversely impacted by the procedure.

Circuit faults

Compaction

Fault detection

Fault diagnosis

Integrated circuit modeling

Merging

System-on-a-chip

Details

Title: Subtitle: Fault diagnosis aware ATE assisted test response compaction
Creators: J M Howard - University of Iowa
S M Reddy - University of Iowa
I Pomeranz - Purdue University West Lafayette
B Becker - Dept. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
Resource Type: Conference proceeding
Publication Details: 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011), pp.812-817
Publisher: IEEE
DOI: 10.1109/ASPDAC.2011.5722302
ISSN: 2153-6961
eISSN: 2153-697X
Language: English
Date published: 01/2011
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197337202771

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