Conference proceeding
Forming N-detection test sets from one-detection test sets without test generation
IEEE International Conference on Test, 2005, Vol.2005, pp.9 pp-535
2005
DOI: 10.1109/TEST.2005.1584013
Abstract
We describe a procedure for forming n-detection test sets for n > 1 without applying a test generation procedure to target faults. The proposed procedure accepts a one-detection test set. It extracts test cubes for target faults from the one-detection test set. It then merges the cubes in different ways to obtain an n-detection test set. We demonstrate that the resulting test set is as effective as an n-detection test set generated by a deterministic test generation procedure in detecting untargeted faults. Merging of cubes does not require test generation or fault simulation. Fault simulation is required for extracting test cubes for target faults
Details
- Title: Subtitle
- Forming N-detection test sets from one-detection test sets without test generation
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- IEEE International Conference on Test, 2005, Vol.2005, pp.9 pp-535
- DOI
- 10.1109/TEST.2005.1584013
- ISSN
- 1089-3539
- eISSN
- 2378-2250
- Publisher
- IEEE
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197412902771
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